发明名称 Test structure and process to give process exactness in the production of aligned structures on substrates forms test patterns with displaceable sections
摘要 A test structure to give process exactness in the production of aligned structures on substrates comprises two test patterns (801,803) produced using two masks which have four overlapping sections (8011-8014,8031-8034) which allow process displacement in four different directions. An Independent claim is also included for a process to produce exact alignment as above.
申请公布号 DE10247486(A1) 申请公布日期 2004.04.22
申请号 DE20021047486 申请日期 2002.10.11
申请人 INFINEON TECHNOLOGIES AG 发明人 GOLLER, KLAUS;MUELLER, MARC;WENZEL, ROLAND
分类号 H01L23/544;(IPC1-7):H01L21/66 主分类号 H01L23/544
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