发明名称 |
Test structure and process to give process exactness in the production of aligned structures on substrates forms test patterns with displaceable sections |
摘要 |
A test structure to give process exactness in the production of aligned structures on substrates comprises two test patterns (801,803) produced using two masks which have four overlapping sections (8011-8014,8031-8034) which allow process displacement in four different directions. An Independent claim is also included for a process to produce exact alignment as above.
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申请公布号 |
DE10247486(A1) |
申请公布日期 |
2004.04.22 |
申请号 |
DE20021047486 |
申请日期 |
2002.10.11 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
GOLLER, KLAUS;MUELLER, MARC;WENZEL, ROLAND |
分类号 |
H01L23/544;(IPC1-7):H01L21/66 |
主分类号 |
H01L23/544 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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