| 摘要 |
PROBLEM TO BE SOLVED: To monitor analog output of arbitrary gradation data in each output terminal, through a simple structure without inputting data from the outside, singly or in a state mounted on a substrate, by means of a driving device for displaying made into IC. SOLUTION: The device is provided with a test signal input terminal, a test clock input terminal, a test start pulse input terminal, and a test output terminal other than a power source terminal, and also provided inside with a test data generating circuit for generating test digital data, and with a test switch installed correspondingly to an output terminal. As a result, with the driver IC as the display driving device used singly or in a state mounted on a substrate, a product inspection or fault analysis is carried out without inputting data from the outside. COPYRIGHT: (C)2004,JPO
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