| 摘要 |
A test plate for holding miniature electronic circuit components on a component testing system as a part of batch processing for parametric testing purposes, including passive, two-terminal, ceramic capacitors, resistors, multilayer inductors, inductor beads, varistors, thermistors, fuses, sensors, actuators, and the like, or another type of device under test (DUT), includes a DUT-holding plate having an upper side, a lower side, and a rotational axis. The DUT-holding plate defines a plurality of DUT-engaging holes extending through the DUT-holding plate from the upper side to the lower along central axes of the DUT-engaging holes that are not parallel to the rotational axis. With the DUT-holding plate oriented so that the rotational axis is not vertical, the DUT-engaging holes change orientation relative to vertical as they orbit the rotational axis. According to a separate aspect, the DUT-holding plate includes upper and lower layers that are bonded together to form the DUT-holding plate. The lower layer defines vacuum passageways for coupling a vacuum source on a vacuum plate portion of the component testing system in fluid communication with each of the DUT-engaging holes. The lower layer is fabricated to include the vacuum passageways and then it is attached to the upper layer in order to enable use of circuit board fabrication techniques instead of machine shop type operations. |
