发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide an internal matching type transistor in which intermodulation strain characteristics are improved. <P>SOLUTION: The internal matching type transistor 1 having a semiconductor element and an internal matching circuit includes a resonance circuit 4 for short-circuiting a differential frequency of signals of different two frequencies as an internal circuit. Thus, the intermodulation strain characteristics in the transistor 1 can be improved. Accordingly, a complicated work of regulating by connecting the resonance circuit out of a semiconductor device is not required, and hence the transistor 1 in which the intermodulation strain characteristics are improved, can be provided as a single component. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004127999(A) 申请公布日期 2004.04.22
申请号 JP20020286257 申请日期 2002.09.30
申请人 MITSUBISHI ELECTRIC CORP 发明人 UCHIUMI HIROZO
分类号 H01L27/06;H01L21/06;H01L21/338;H01L21/8232;H01L23/34;H01L23/66;H01L29/812 主分类号 H01L27/06
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