发明名称 Material defect evaluation apparatus and method measuring positron lifetimes
摘要 A material defect evaluation apparatus using positron for evaluating the degree of deterioration of a specimen by measuring a positron lifetime after irradiating positron to the specimen, includes: a positron source, a positron detector and a gamma -ray detector, wherein, the positron source and the positron detector are arranged in a container through which a light is not transmitted, and, a positron transmitting window, through which positron emanating from the positron source and transmitting through the positron detector is transmitted outward, is arranged to the container. <IMAGE>
申请公布号 EP1376109(A3) 申请公布日期 2004.04.21
申请号 EP20030254124 申请日期 2003.06.27
申请人 OSAKA UNIVERSITY 发明人 SHIRAI, YASUHARU;ARAKI, HIDEKI
分类号 G01Q30/08;G01N23/22;G01T1/16;G01T1/24 主分类号 G01Q30/08
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