Semiconductor memory device and testing system and testing method

摘要

The semiconductor memory device includes a reference potential set-up circuit (150) which sets up a predetermined potential assigned from the outside of the device as the potential of a reference signal. A reference signal generator produces the reference signal when an amplifier amplifies a data signal occurring on the bit lines. The amplified data signal is compared with the reference signal. Independent claims are also included for the following: (a) a semiconductor memory device testing system; and (b) a semiconductor memory device testing method.