发明名称 |
Maximum time interval error test signal generating apparatus not affected by low-pass measuring filter |
摘要 |
<p>A setting unit (23) sets holding time for holding the upper limit value and lower limit value of the repetitive waveform of signal over a predetermined time, so that signal cycle having shortest cycle with several signals generated by signal generating units (24(1)-24(n)) is longer than predetermined time corresponding to the predetermined high-cut characteristics of low-pass measuring filter.</p> |
申请公布号 |
EP1411660(A2) |
申请公布日期 |
2004.04.21 |
申请号 |
EP20030023534 |
申请日期 |
2003.10.15 |
申请人 |
ANRITSU CORPORATION |
发明人 |
MOCHIZUKI, KEN;SUGIYAMA, OSAMU |
分类号 |
H04L27/18;H04B7/26;H04J3/06;H04J3/14;H04L1/20;H04L1/24;H04L25/02;(IPC1-7):H04J3/14;G01R25/00 |
主分类号 |
H04L27/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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