A software programmable verification tool having a single built-in self-test (bist) module for testing and debugging multiple memory modules in a device under test (dut)

摘要

An instruction is loaded into a parameterized shift register of a built-in self-test (BIST) coupled to each of the embedded memory modules (104). The test signals corresponding to the determined identity of the loaded instruction, for controlling and execution of testing and debugging a corresponding module, are generated. Independent claims are also included for the following: (1) system for testing and debugging embedded memory module; and (2) machine-readable storage storing computer program for testing and debugging embedded memory module.