A software programmable verification tool having multiple built-in self-test (bist) modules for testing and debugging multiple devices under test (dut)

摘要

An instruction is loaded into a shift register of each built-in self-test (BIST) module coupled to respective embedded memory modules of device under test (DUT). An identity of each loaded instruction, is determined. The test signal are generated by the BIST modules based on determined identities. The testing and debugging of embedded memory (104) modules are carried out using respective test signals. Independent claims are also included for the following: (1) system for testing and debugging embedded device under test; and (2) machine readable storage medium storing embedded device under testing and debugging program.