| 摘要 |
A device carrier capable of reliably measuring electric characteristics of the device with accuracy and an auto-handle are provided. The device carrier holds an IC having terminals on a lower face thereof at multiple positions, and allows the terminals to be brought into contact with contacts provided on an IC socket, wherein the device carrier comprises an opening through which the device can pass, a support part disposed on the opening for supporting the lower face of the IC, and a hinge part for turnably supporting the support part, wherein said supporter part is turned to release the support of the device when the socket approaches thereto. The supporter part engages with the release pins as the device carrier approaches to the IC socket to be turned so as to release the support of the lower face of the IC. The IC which has been released from being supported by the supporter part passes through the opening and is placed on the IC socket.
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