Wavelength monitor and laser module

摘要

A wavelength monitor capable of obtaining an optical detection signal of high quality is proposed. In the wavelength monitor, a light incident surface of an optical filter is disposed with an inclination relative to the light incident direction. With this arrangement, it is possible to make the route of a reflection light that has been reflected from the light incident surface of the optical filter deviate large from the route of an incident light that has been incident to the optical filter. Consequently, the reflected light is prevented from being incident to a semiconductor laser device or optical detectors.