发明名称 METHOD OF TOPICAL DIAGNOSING BRAIN DAMAGE FOCUS
摘要 This invention relates to the field of radiological and neurological topical diagnosing focus of brain damage. The method allows to find out 1-2 mm foci and to distinguish them in cases of multiple sclerosis, inflammation, including tuberculosis, neoplasm and other CNS disorders. The method comprises application of MNR using spin echo SE T1 program in standard regimen, fast spin echo FSE T2 program in standard regimen and FLAIR program. The investigation by FLAIR is performed between signals (TR) 11 000 ms, during response signal (TE) 160 ms and during turn of vector of signal (TI) 2200 ms. The thickness of the layer under investigation is 3 mm with distance between layers - 0,5 mm, field size of image is 24 cm and matrix - 256x256.
申请公布号 LV13097(B) 申请公布日期 2004.04.20
申请号 LV20020000088 申请日期 2002.05.27
申请人 PLATKAJIS,ARDIS 发明人 PLATKAJIS,ARDIS;KRUMINA,GAIDA
分类号 A61B5/055;(IPC1-7):A61B5/055 主分类号 A61B5/055
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