发明名称 |
Method for assessing the reliability of interconnects |
摘要 |
A methodology for testing interconnect structures includes testing a number of short line interconnects having the same length and different reservoir sizes. By measuring and comparing the stress values on the interconnects, a relationship between reservoir area and jLcrit may be obtained. This information may then be used to more accurately assess the reliability of an interconnect and to design more reliable interconnects.
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申请公布号 |
US6725433(B1) |
申请公布日期 |
2004.04.20 |
申请号 |
US20020252680 |
申请日期 |
2002.09.24 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
HAU-RIEGE CHRISTINE;MARATHE AMIT |
分类号 |
G01R31/28;G06F17/50;(IPC1-7):G06F17/50 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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