发明名称 Method for assessing the reliability of interconnects
摘要 A methodology for testing interconnect structures includes testing a number of short line interconnects having the same length and different reservoir sizes. By measuring and comparing the stress values on the interconnects, a relationship between reservoir area and jLcrit may be obtained. This information may then be used to more accurately assess the reliability of an interconnect and to design more reliable interconnects.
申请公布号 US6725433(B1) 申请公布日期 2004.04.20
申请号 US20020252680 申请日期 2002.09.24
申请人 ADVANCED MICRO DEVICES, INC. 发明人 HAU-RIEGE CHRISTINE;MARATHE AMIT
分类号 G01R31/28;G06F17/50;(IPC1-7):G06F17/50 主分类号 G01R31/28
代理机构 代理人
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