发明名称 Thin film deposition method including using atomic layer deposition without purging between introducing the gaseous reactants
摘要 The present invention discloses a method of fabricating a thin film in a chamber where a heater and a suscepter are located. The method includes the steps of disposing an object on the susceptor so as to form the thin film thereon; heating the object; a first sub-step of introducing a first gaseous reactant into the first chamber such that the first gaseous reactant is absorbed on the object to form an absorption layer; a second sub-step of introducing a second gaseous reactant into the first chamber such that the second gaseous reactant reacts with the absorption layer absorbed on the object; and a third sub-step of introducing a reducing gas into the first camber such that the reducing gas reduces by-products and impurities of the first and second gaseous reactants.
申请公布号 US6723595(B2) 申请公布日期 2004.04.20
申请号 US20020061704 申请日期 2002.02.01
申请人 JUSUNG ENGINEERING CO., LTD. 发明人 PARK CHANG-BOO
分类号 H01L21/205;C23C16/44;C23C16/455;(IPC1-7):H01L21/828;H01L21/824;H01L21/31;H01L21/469 主分类号 H01L21/205
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