发明名称 Projection exposure apparatus and method
摘要 A scanning exposure apparatus and method in which an interferometer, operatively connected to a stage holding a mask or a substrate, outputs a measurement value corresponding to positional information of the stage in the scanning direction. Start and stop timing of the output of trigger signals for the emission of pulses of an exposure beam emitted at predetermined time intervals is controlled based on the measurement value from the interferometer.
申请公布号 US6724463(B2) 申请公布日期 2004.04.20
申请号 US20010911619 申请日期 2001.07.25
申请人 NIKON CORPORATION 发明人 TANIGUCHI TETSUO
分类号 G03F7/207;B60R16/02;B60R16/027;B60R21/01;G03F7/20;H01L21/027;H01L21/30;(IPC1-7):G03B27/42;G03B27/54;G03B27/72 主分类号 G03F7/207
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