发明名称 Microchip fabrication chamber wafer detection
摘要 A microchip fabrication chamber has a pedestal adapted to retain a wafer during processing steps conducted within the chamber. A lift mechanism including a plurality of lift mechanism pins engages and disengages a wafer to the pedestal. A sensor associated with the tip of at least one of the lift mechanism pins detects the presence of the wafer.
申请公布号 US6723201(B2) 申请公布日期 2004.04.20
申请号 US20020081665 申请日期 2002.02.21
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHEN WEN-MING;WANG WEN-CHI
分类号 C23C16/458;H01L21/00;(IPC1-7):H01L21/00;C23C16/00 主分类号 C23C16/458
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