发明名称 |
METHOD FOR FORMING NON-VOLATILE MEMORY DEVICE |
摘要 |
PURPOSE: A method for forming a non-volatile memory device is provided to be capable of preventing the generation of a bridge phenomenon due to the interval reduction between floating gate electrodes. CONSTITUTION: A tunnel isolating pattern(102a), the first floating gate pattern(103a), and a trench(106) are sequentially formed at the upper portion of a semiconductor substrate(101). Then, the trench is filled with an isolation layer(107a). An etch stop layer(110a) and a mold layer(111a) are sequentially formed on the entire surface of the resultant structure. A groove(114a) is formed by sequentially patterning the mold layer and the etch stop layer for exposing the first floating gate pattern. Then, the groove is filled with the second floating gate pattern(115a).
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申请公布号 |
KR20040032530(A) |
申请公布日期 |
2004.04.17 |
申请号 |
KR20020061719 |
申请日期 |
2002.10.10 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JANG, DONG SU;PARK, SE UNG |
分类号 |
H01L21/8247;H01L27/115;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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