发明名称 METHOD FOR FORMING NON-VOLATILE MEMORY DEVICE
摘要 PURPOSE: A method for forming a non-volatile memory device is provided to be capable of preventing the generation of a bridge phenomenon due to the interval reduction between floating gate electrodes. CONSTITUTION: A tunnel isolating pattern(102a), the first floating gate pattern(103a), and a trench(106) are sequentially formed at the upper portion of a semiconductor substrate(101). Then, the trench is filled with an isolation layer(107a). An etch stop layer(110a) and a mold layer(111a) are sequentially formed on the entire surface of the resultant structure. A groove(114a) is formed by sequentially patterning the mold layer and the etch stop layer for exposing the first floating gate pattern. Then, the groove is filled with the second floating gate pattern(115a).
申请公布号 KR20040032530(A) 申请公布日期 2004.04.17
申请号 KR20020061719 申请日期 2002.10.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JANG, DONG SU;PARK, SE UNG
分类号 H01L21/8247;H01L27/115;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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