发明名称 METHOD FOR ETCHING SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method which enables a selective etching of a rear layer, while protecting the front of a semiconductor substrate as simply as possible. SOLUTION: The method enables the selective etching of the backside layer 10 of the semiconductor substrate 1 whose layer on the front is different from that on the rear. Specifically, after protecting the front of the substrate 1 by adhering an etchant-resistant resin film 2 thereto, the backside layer 10 of the substrate 1 is etched using an etchant. Then, the resin film 2 is separated from the substrate 1. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004119843(A) 申请公布日期 2004.04.15
申请号 JP20020283669 申请日期 2002.09.27
申请人 DOWA MINING CO LTD 发明人 MATSUOKA HIROYUKI;WATANABE HARUHIKO
分类号 H01L21/306;H01L21/02;(IPC1-7):H01L21/306 主分类号 H01L21/306
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