发明名称 VACUUM SUCTION APPARATUS, SUBSTRATE TRANSPORT PLATE, AND SUBSTRATE PROCESSING EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide a vacuum suction apparatus which can eliminate particles adhered to a placing part or the like of a vacuum suction apparatus without needing manual cleaning work or the like, and can restrain complication of device structure and increase of manufacturing cost by realizing elimination of particles with simple constitution, and to provide a substrate transport plate and substrate processing equipment. SOLUTION: When a semiconductor wafer W is sucked and held and it is conveyed, a changeover value 5 is switched to suction source 4 side, Suction of a suction opening 2c is performed through a suction lateral 1a, and the semiconductor wafer W is sucked and held on the placing part 2. When cleaning of the changeover 2 is performed, the changeover valve 5 is switched to cleaning gas supply source 6 side, and gas for cleaning (e.g. air, nitrogen gas, etc.) is supplied from the cleaning gas supply source 6, through a suction lateral 3 and the suction lateral 1a. The gas is spouted from the suction opening 2c. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004119488(A) 申请公布日期 2004.04.15
申请号 JP20020277683 申请日期 2002.09.24
申请人 TOKYO ELECTRON LTD 发明人 IGARI HIROSHI
分类号 B25J15/06;B65G49/06;B65G49/07;H01L21/677;H01L21/68;H01L21/683;(IPC1-7):H01L21/68 主分类号 B25J15/06
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