发明名称 Contactor apparatus for semiconductor devices and a test method of semiconductor devices
摘要 A contactor apparatus having a first contactor (2) and a second contactor (4) acquires an electrical conduction to a plurality of semiconductor devices formed on a semiconductor wafer (6). The first contactor (2) has contacts (2b) which are directly brought into contact with power supply terminals (6a) of the semiconductor devices. The second contactor (4) is movable relative to the first contactor (2) and has contacts (4a) which are brought into contact with signal terminals (6b) of the semiconductor devices. Thereby, the number of contacts to be formed on a single contactor can be reduced and the number of pattern wirings can also be reduced, which makes the fabrication of the contactor easier.
申请公布号 US2004070961(A1) 申请公布日期 2004.04.15
申请号 US20030677378 申请日期 2003.10.03
申请人 发明人 HASEYAMA MAKOTO
分类号 G01R1/073;G01R31/28;H01L21/66;(IPC1-7):H05K1/11;H05K1/14 主分类号 G01R1/073
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