发明名称 |
Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor |
摘要 |
A contactor is used for testing an integrated circuit electronic component provided with a plurality of electrodes. The contactor includes an insulating base material provided with holes formed at positions corresponding to the electrodes, a first conductive layer having contacts which are plastically deformed portions of the first conductive layer, and reinforcement members provided on the contacts on a first surface of the contacts. The first surface of the contacts is facing towards the holes. The contacts are provided at positions corresponding to the electrodes for enabling an electrical connection to the electronic component and are protruded from the insulating base material.
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申请公布号 |
US2004070010(A1) |
申请公布日期 |
2004.04.15 |
申请号 |
US20030629800 |
申请日期 |
2003.07.30 |
申请人 |
FUJITSU LIMITED |
发明人 |
HASEYAMA MAKOTO;MARUYAMA SHIGEYUKI |
分类号 |
H05K1/11;G01R1/067;G01R1/073;G01R3/00;G01R31/26;H01L21/60;H01L21/66;H05K1/02;H05K3/24;H05K3/40;H05K3/42;(IPC1-7):H01L29/768 |
主分类号 |
H05K1/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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