发明名称 STRESS CONTROL OF SEMICONDUCTOR MICROSTRUCTURES FOR THIN FILM GROWTH
摘要 A suspended semiconductor film is anchored to a substrate at at least two opposed anchor positions, and film segments are deposited on the semiconductor film adjacent to one or more of the anchor positions to apply either tensile or compressive stress to the semiconductor film between the film segments. A crystalline silicon film may be anchored to the substrate and have tensile stress applied thereto to reduce the lattice mismatch between the silicon and a silicon-germanium layer deposited onto the silicon film. By controlling the level of stress in the silicon film, the size, density and distribution of quantum dots formed in a high germanium content silicon-germanium film deposited on the silicon film can be controlled.
申请公布号 WO03045837(A3) 申请公布日期 2004.04.15
申请号 WO2002US37503 申请日期 2002.11.22
申请人 WISCONSIN ALUMNI RESEARCH FOUNDATION 发明人 LAL, AMIT;LAGALLY, MAX, G.;LEE, CHUNG-HOON;RUGHEIMER, PAUL, POWEL
分类号 B81B3/00;B81C1/00;H01L29/04;H01L29/786;H01L29/80;H01L29/82;H01L31/036;H01L31/112 主分类号 B81B3/00
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