发明名称 A METHOD FOR PHOTOLITHOGRAPHY USING MULTIPLE ILLUMINATIONS AND A SINGLE FINE FEATURE MASK
摘要 A method forms a feature pattern on a substrate by exposing the substrate (726 of Figure 17), using a mask (722 of Figure 17) having a pattern of features (832 of Figure 17) thereon, with illumination having a first set of settings (23 of Figure 17). The substrate is exposed a second time, using the same mask having the pattern of features thereon, with illumination having a second set of settings (723 of Figure 17). The mask having the pattern of features thereon remains stationary between the two illumination exposures of the substrate.
申请公布号 WO03102696(A3) 申请公布日期 2004.04.15
申请号 WO2003US16862 申请日期 2003.05.29
申请人 MASSACHUSETTS INSTITUTE OF TECHNOLOGY 发明人 FRITZE, MICHAEL;TYRELL, BRIAN, M.
分类号 G03B27/48 主分类号 G03B27/48
代理机构 代理人
主权项
地址