发明名称 MEASURING METHOD AND APPARATUS USING TOTAL REFLECTION ATTENUATION
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a compact apparatus for reducing stray light as a measuring apparatus for making a light beam as parallel luminous, flux having a large cross-sectional area onto a measuring surface and detecting the light intensity distribution of the cross section of a light beam of a prescribed wavelength in the light beam reflected at the measuring surface. <P>SOLUTION: The light beam L as the parallel luminous flux, having a sufficient cross-sectional area, is made incident at such an angle as to achieve total reflection conditions at an interface 11a to a metal membrane 12 on a dielectric prism 11. The light beam L1 of a prescribed wavelength is selected by a wavelength selecting part 20 from the light beam L, reflected totally at the interface 11a to detect its light intensity distribution. Stray light is removed by the wavelength-selecting part 20. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004117298(A) 申请公布日期 2004.04.15
申请号 JP20020284122 申请日期 2002.09.27
申请人 FUJI PHOTO FILM CO LTD 发明人 NAYA MASAYUKI
分类号 G01N21/03;G01N21/05;G01N21/27;G01N21/41;(IPC1-7):G01N21/27 主分类号 G01N21/03
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