| 摘要 |
PROBLEM TO BE SOLVED: To provide a format circuit for saving time and labor without the need for reconstructing an integrated circuit (IC) when requirements for a change and addition of a wavy format with a change of a device under test (DUT) are out of specifications. SOLUTION: The format circuit has a decoding circuit for specifying the validity or not of a plurality of edge signals as bases of test signals to be given to the DUT in accordance with the format signals for specifying the wavy format of the test signals to the DUT. The decoding circuit has a table for storing connection information for electrical connection and a reconnection means for changing the electrical connection of an internal circuit in accordance with the connection information. COPYRIGHT: (C)2004,JPO
|
