发明名称 |
Single point probe structure and method |
摘要 |
One or more termination circuits or networks having compensation properties that are operative to reduce reflections occurring between a probe utilized by a test and measurement analyzer to test a device under test (DUT), such as an integrated circuit device, and the device under test itself are employed. The termination circuits are preferably small and less obtrusive than larger connectors and their compensation networking compensates for the connection of the probe to the DUT as well as connection of the cable from the probe to the analyzer performing the test and measurement function. The functionality of the termination circuits may be located at the DUT in a termination network connector or within the structure of the probe itself.
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申请公布号 |
US2004070411(A1) |
申请公布日期 |
2004.04.15 |
申请号 |
US20020267435 |
申请日期 |
2002.10.09 |
申请人 |
SELF BOB J.;HALL KEVIN M. |
发明人 |
SELF BOB J.;HALL KEVIN M. |
分类号 |
G01R1/073;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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