发明名称 SUPPORTING APPARATUS OF SUBSTRATE TO BE INSPECTED
摘要 PROBLEM TO BE SOLVED: To use a supporting apparatus for inspecting substrates to be inspected whose sizes differ. SOLUTION: In the supporting apparatus, a pair of movable bodies is placed so that it can travel in a direction for approaching or separating from a lower base, a plurality of elevation members for receiving the substrates to be inspected are arranged on the upper base so that they can travel up and down, up/down movement is made by an up/down movement mechanism for elevating the elevation members to pass the substrates, the movable bodies are moved in a direction for approaching or separating each other by the movement mechanism when inspecting the substrates to be inspected whose sizes differ, thus changing to the upper base according to new substrates to be inspected. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004117023(A) 申请公布日期 2004.04.15
申请号 JP20020277143 申请日期 2002.09.24
申请人 MICRONICS JAPAN CO LTD 发明人 SAITO TAKESHI;FUJIWARA SHINJI
分类号 G01R31/00;B25B11/00;G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/00
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