发明名称 REGRESSION TEST SYSTEM FOR LSI CIRCUIT, DEVICE USED FOR THE SAME AND REGRESSION TEST METHOD
摘要 PROBLEM TO BE SOLVED: To determine whether a regression test is necessary every time the design of an LSI circuit under verification is changed and execute the test if necessary. SOLUTION: In a data management device 1, input design data 11 and a test bench 12 are registered in a database 13 while a difference check between already registered data and them is being executed and data corresponding to the contents of the verification are transmitted to a simulation device 2. When a difference exists in the input design data in the difference check, an inquiry whether a regression test is being executed (or reserved) in the simulation device is made. If yes, the regression test is stopped after the acquisition of a user's confirmation. If not or already stopped, the test bench relating to the latest design data is read from the database after the acquisition of the user's confirmation and transmitted in combination with the latest design data to the simulation device. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004118443(A) 申请公布日期 2004.04.15
申请号 JP20020279644 申请日期 2002.09.25
申请人 NEC CORP 发明人 EMI TAKAO
分类号 G06F17/50;H01L21/82;(IPC1-7):G06F17/50 主分类号 G06F17/50
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