发明名称 INSPECTION DEVICE, INSPECTING METHOD, MANUFACTURING METHOD OF ELECTRO-OPTICAL DEVICE, AND ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an inspection device for simply inspecting modules without damaging connection terminals of the modules of an electro-optical devices used for electronic apparatuses by an inspection pin, and to provide an inspecting method, a manufacturing method of the electro-optical device using the inspection device, and an electronic apparatus equipped with the electro-optical device manufactured by this method. SOLUTION: A rising and setting means is provided in an inspection device 1 for preventing the inspection pin 6 from projecting from an inspection opening 7 of a placing table 4, when placing the module 21 of a liquid crystal device, for example, to be inspected on the placing table 4. This allows inspection of the connection terminal 29 or the like of the module 21 without damaging by the inspection pin 6, to further improve the quality of the liquid crystal device. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004117821(A) 申请公布日期 2004.04.15
申请号 JP20020280920 申请日期 2002.09.26
申请人 SEIKO EPSON CORP 发明人 KIKUCHI HIROKI
分类号 G02F1/13;G09F9/00;(IPC1-7):G09F9/00 主分类号 G02F1/13
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