发明名称 NROM memory cell
摘要 An NROM memory cell is of a planar configuration without an additional oxidation being affected for the fabrication of the bit line oxide. The ONO layer is provided as a memory layer and is disposed with a uniform thickness on the semiconductor material of the source and drain regions and of the channel region, so that the ONO layer forms not only the gate dielectric, but also the insulation of the bit lines from the word lines or the gate electrode.
申请公布号 US2004070025(A1) 申请公布日期 2004.04.15
申请号 US20030426523 申请日期 2003.04.30
申请人 EITAN BOAZ;KAMIENSKI ELARD STEIN VON;RIEDEL STEPHAN;SHAPPIR ASSAF 发明人 EITAN BOAZ;KAMIENSKI ELARD STEIN VON;RIEDEL STEPHAN;SHAPPIR ASSAF
分类号 H01L21/28;H01L21/336;H01L21/8246;H01L27/115;(IPC1-7):H01L29/792 主分类号 H01L21/28
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