发明名称 TRANSMISSION TYPE ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a transmission type electron microscope capable of observing an initial growth stage of a thin film formed by sputtering in real time. SOLUTION: The transmission type electron microscope housing 2 has a sputtering gun 10, which emits sputtering particles from a target cathode 16 when generating plasma in the electron microscope housing 2 and deposits the particles on a substrate 3. In the electron microscope housing 2, when the sputtering particles are deposited on the substrate 3, an electronic beam transmitted through the substrate 3 enters, and the initial growth stage of the thin film formed on the substrate 3 can be photographed by a CCD camera 5, and a photographed image is displayed on a display 7 in real time. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004119291(A) 申请公布日期 2004.04.15
申请号 JP20020283884 申请日期 2002.09.27
申请人 JAPAN SCIENCE & TECHNOLOGY CORP 发明人 ONUKI HITOSHI;KOMIYAMA TAKAO
分类号 C23C14/34;H01J37/20;H01J37/26;H01L21/66;(IPC1-7):H01J37/26 主分类号 C23C14/34
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