发明名称 METHOD FOR EXTRACTING OUTPUT OF IRREGULAR ELECTRON BEAM BY SIMPLIFIED TWO-SOURCE MODEL
摘要 PURPOSE: A method for extracting output of irregular electron beams by a simplified two-source model is provided to obtain a few factors and apply the factors to a simplified two-source model, thereby accurately extracting a relative output factor of irregular electron beams within a short time when the electron beams are applied to a patient. CONSTITUTION: A relative output factor of irregular electron beams is extracted by obtaining effective SSD(fe) of each electron beam energy, the distance of a source, and a secondary rate per unit length generated in a block with using a simplified two-source model.
申请公布号 KR20040031876(A) 申请公布日期 2004.04.14
申请号 KR20020061012 申请日期 2002.10.07
申请人 CHO, BYUNG CHUL;KO, YOUNG EUN;YI, BYONG YONG 发明人 CHO, BYUNG CHUL;KO, YOUNG EUN;YI, BYONG YONG
分类号 G01N23/06;(IPC1-7):G01N23/06 主分类号 G01N23/06
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