发明名称 |
METHOD FOR EXTRACTING OUTPUT OF IRREGULAR ELECTRON BEAM BY SIMPLIFIED TWO-SOURCE MODEL |
摘要 |
PURPOSE: A method for extracting output of irregular electron beams by a simplified two-source model is provided to obtain a few factors and apply the factors to a simplified two-source model, thereby accurately extracting a relative output factor of irregular electron beams within a short time when the electron beams are applied to a patient. CONSTITUTION: A relative output factor of irregular electron beams is extracted by obtaining effective SSD(fe) of each electron beam energy, the distance of a source, and a secondary rate per unit length generated in a block with using a simplified two-source model.
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申请公布号 |
KR20040031876(A) |
申请公布日期 |
2004.04.14 |
申请号 |
KR20020061012 |
申请日期 |
2002.10.07 |
申请人 |
CHO, BYUNG CHUL;KO, YOUNG EUN;YI, BYONG YONG |
发明人 |
CHO, BYUNG CHUL;KO, YOUNG EUN;YI, BYONG YONG |
分类号 |
G01N23/06;(IPC1-7):G01N23/06 |
主分类号 |
G01N23/06 |
代理机构 |
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地址 |
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