发明名称 Microscope and method for analyzing acquired scan data
摘要 A method and system for analyzing acquired scan data are disclosed. The method involves measuring physical values of a particular process, converting the measured values into two signals, such as electrical signals, and then converting the two signals into polar coordinates by defining a vector having a radial magnitude and a vector angle corresponding to the magnitudes of the two signals. The method further provides for validation and visual representation of the measured physical values by employing the angle information to define the upper and lower bounds of the acceptable measured values. The corresponding system comprises sensors measuring the two physical values and yielding the two signals. A signal processing unit receives the two signals, converts them into a pair of polar coordinates defines by the magnitude of the two signals.
申请公布号 US6721690(B2) 申请公布日期 2004.04.13
申请号 US20000681051 申请日期 2000.12.10
申请人 LEICA MICROSYSTEMS 发明人 OLSCHEWSKI FRANK
分类号 G02B21/00;G02B21/16;(IPC1-7):G06F3/00 主分类号 G02B21/00
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