发明名称 Pulsed eddy current two-dimensional sensor array inspection probe and system
摘要 A pulsed eddy current two-dimensional sensor array probe for electrically conducting component inspection includes a drive coil disposed adjacent to a structure under inspection, a pulse generator connected to the drive coil and operable to energize in a pulsed manner the drive coil to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors arranged in a two-dimensional array and substantially surrounded by the drive coil and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.
申请公布号 US6720775(B2) 申请公布日期 2004.04.13
申请号 US20010681824 申请日期 2001.06.12
申请人 GENERAL ELECTRIC COMPANY 发明人 PLOTNIKOV YURI ALEXEYEVICH;NATH SHRIDHAR CHAMPAKNATH;ROSE CURTIS WAYNE;BATZINGER THOMAS JAMES;HERD KENNETH GORDON
分类号 G01N27/90;(IPC1-7):G01R31/28;G01N27/82;G01R33/12 主分类号 G01N27/90
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