发明名称 |
Pulsed eddy current two-dimensional sensor array inspection probe and system |
摘要 |
A pulsed eddy current two-dimensional sensor array probe for electrically conducting component inspection includes a drive coil disposed adjacent to a structure under inspection, a pulse generator connected to the drive coil and operable to energize in a pulsed manner the drive coil to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors arranged in a two-dimensional array and substantially surrounded by the drive coil and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.
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申请公布号 |
US6720775(B2) |
申请公布日期 |
2004.04.13 |
申请号 |
US20010681824 |
申请日期 |
2001.06.12 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
PLOTNIKOV YURI ALEXEYEVICH;NATH SHRIDHAR CHAMPAKNATH;ROSE CURTIS WAYNE;BATZINGER THOMAS JAMES;HERD KENNETH GORDON |
分类号 |
G01N27/90;(IPC1-7):G01R31/28;G01N27/82;G01R33/12 |
主分类号 |
G01N27/90 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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