发明名称 Method of erasing flash memory cells
摘要 The present invention relates to a method of erasing flash memory cells. In the flash memory cell having a substrate, a source, a drain, a tunnel oxide film, a floating gate, a dielectric film and a control gate, the method of erasing the flash memory cell comprises the steps of performing an erase operation for the cell, by applying a negative voltage being an erase voltage to the control gate and a positive voltage being an erase voltage to the substrate, discharging the control gate by making the control gate grounded, discharging the source by making the source grounded, and simultaneously performing a discharge operation and a recovery operation by making the substrate grounded. Therefore, the threshold voltages of the cells can be converted to have a constant voltage even though additional recovery operation is not performed.
申请公布号 US6721208(B2) 申请公布日期 2004.04.13
申请号 US20020315246 申请日期 2002.12.10
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG SUNG MUN;KIM JUM SOO
分类号 G11C16/02;G11C16/16;G11C16/34;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/04 主分类号 G11C16/02
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