发明名称 |
Exposure apparatus and exposure method |
摘要 |
A photolithography exposure apparatus exposes a substrate to a pattern image formed on a mask to transfer the pattern onto the substrate. The apparatus includes a substrate stage on which the substrate is mounted. The substrate stage together with the substrate is movable when the substrate is being exposed to the pattern image. A memory stores pattern image distortion information generated in accordance with an exposure position on the substrate when the pattern image is being transferred onto the substrate. A compensator compensates for the distortion so that the pattern is formed cleanly on the substrate.
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申请公布号 |
US6721033(B1) |
申请公布日期 |
2004.04.13 |
申请号 |
US20000615461 |
申请日期 |
2000.07.13 |
申请人 |
NIKON CORPORATION |
发明人 |
KANEKO KENICHIROU |
分类号 |
G03B27/32;G03F7/20;H01L21/027;(IPC1-7):G03B27/68;G03B27/42;G03F9/00;A61N5/00 |
主分类号 |
G03B27/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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