发明名称 Exposure apparatus and exposure method
摘要 A photolithography exposure apparatus exposes a substrate to a pattern image formed on a mask to transfer the pattern onto the substrate. The apparatus includes a substrate stage on which the substrate is mounted. The substrate stage together with the substrate is movable when the substrate is being exposed to the pattern image. A memory stores pattern image distortion information generated in accordance with an exposure position on the substrate when the pattern image is being transferred onto the substrate. A compensator compensates for the distortion so that the pattern is formed cleanly on the substrate.
申请公布号 US6721033(B1) 申请公布日期 2004.04.13
申请号 US20000615461 申请日期 2000.07.13
申请人 NIKON CORPORATION 发明人 KANEKO KENICHIROU
分类号 G03B27/32;G03F7/20;H01L21/027;(IPC1-7):G03B27/68;G03B27/42;G03F9/00;A61N5/00 主分类号 G03B27/32
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