发明名称 LOW DIELECTRIC MATERIAL AND PREPARATION METHOD THEREOF SHOWING LOW DIELECTRIC CONSTANT, INCREASED ELASTIC MODULUS WHEN USED AS INTERLEVEL DIELECTRICS IN INTEGRATED CIRCUITS
摘要 <p>PURPOSE: A low dielectric material is provided to lower dielectric constant expressed through a higher normalized wall elastic modulus, and to increase elastic modulus and mechanical strength when used as interlevel dielectrics in electronic elements such as integrated circuits(IC), thereby improving the performance of the electronic device. CONSTITUTION: The low dielectric material has a dielectric constant of about 3.7 or less; a normalized wall elastic modulus(Eo'), which is derived in part from the dielectric constant of the material, of about 15 GPa or more; and a metal impurity level of about 500 ppm or less. The method for preparing said low dielectric material comprises: providing a mixture comprising the product from the hydrolysis and condensation of at least one silica source and at least one porogen, wherein the mixture has a metal impurity content of about 500 ppm or less; dispensing the mixture onto a substrate to form a coated substrate; and curing the coated substrate by using one or more temperatures and for a time sufficient to form a dielectric film.</p>
申请公布号 KR20040030216(A) 申请公布日期 2004.04.09
申请号 KR20030034780 申请日期 2003.05.30
申请人 AIR PRODUCTS AND CHEMICALS INC. 发明人 KIRNER JOHN FRANCIS;MACDOUGALL JAMES EDWARD;PETERSON BRIAN KEITH;WEIGEL SCOTT JEFFREY;DEIS THOMAS ALAN;DEVENNEY MARTIN;RAMBERG C. ERIC;CHONDROUDIS KONSTANTINOS;CENDAK KEITH
分类号 H01L21/768;C01B33/16;H01B3/12;H01B3/46;H01L21/312;H01L21/316;H01L23/522;(IPC1-7):H01B3/12 主分类号 H01L21/768
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