发明名称 EUVL MULTILAYER STRUCTURES
摘要 The reflectivity and thermal stability of Mo/Si (molybdenum/silicon) multilayer films, used in soft x-ray and extreme ultraviolet region, is enhanced by deposition of a thin layer of boron carbide (e.g., B4C) between alternating layers of Mo and Si. The invention is useful for reflective coatings for soft X-ray and extreme ultraviolet optics, multilayer for masks, coatings for other wavelengths and multilayers for masks that are more thermally stable than pure Mo/Si multilayers
申请公布号 KR20040030571(A) 申请公布日期 2004.04.09
申请号 KR20037013221 申请日期 2003.10.09
申请人 发明人
分类号 G03F1/30;G03F1/22;G03F7/20;G21K1/06;H01L21/027 主分类号 G03F1/30
代理机构 代理人
主权项
地址
您可能感兴趣的专利