| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of applying large stress by less number of terminals. SOLUTION: The semiconductor having flip-flop with a plurality of scanning functions constituting a scan chain is provided with a BIST circuit generating a signal for switching a scan shift action of the scan chain and a scan capture action. In the testing of the semiconductor device, an output signal of the BIST circuit is inputted to a scan shift/capture switching terminal of the flip-flop with the scan function. COPYRIGHT: (C)2004,JPO
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