发明名称 |
BITFEHLERKARTEN-KOMPRESSION MIT SIGNATURANALYSE |
摘要 |
A method for providing a compressed bit fail map, in accordance with the invention includes the steps of testing a semiconductor device to determine failed devices and transferring failure information to display a compressed bit map by designating areas of the bit map for corresponding failure locations on the semiconductor device. Failure classification is provided by designating shapes and dimensions of fail areas in the designated areas of the bit map such that the fail area shapes and dimensions indicate a fail type. |
申请公布号 |
DE60008789(D1) |
申请公布日期 |
2004.04.08 |
申请号 |
DE2000608789 |
申请日期 |
2000.12.05 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
VOLLRATH, JOERG;HLADSCHIK, THOMAS;ANDREAS, ZSCHUNKE;OSWALD, PETER;LEDERER, ULF;HAROLD, RAUSCH |
分类号 |
G01R31/3193;G11C29/00;G11C29/56;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/3193 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|