发明名称 |
HETEROJUNCTION BIPOLAR TRANSISTOR AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A heterojunction bipolar transistor and its fabricating method are provided to minimize the stress transferred to a SiGe layer and prevent the leakage current by depositing an undoped polysilicon layer as a grain boundary on a SiGe base layer before forming an emitter layer. CONSTITUTION: A heterojunction bipolar transistor includes a semiconductor substrate(100), a SiGe base layer(130), and an emitter layer(160). The semiconductor substrate(100) includes impurities to perform a function of a collector. The SiGe base layer(130) is formed on the semiconductor substrate(100). The emitter layer(160) is formed by depositing a polysilicon layer on the SiGe base layer(130). A seed layer(140) is inserted between a grain the SiGe base layer(130) and the emitter layer(160) in order to determine a grain boundary of the emitter layer.
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申请公布号 |
KR20040029526(A) |
申请公布日期 |
2004.04.08 |
申请号 |
KR20020059825 |
申请日期 |
2002.10.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SANG DON;SHIN, HEON JONG |
分类号 |
H01L29/737;(IPC1-7):H01L29/737 |
主分类号 |
H01L29/737 |
代理机构 |
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主权项 |
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地址 |
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