发明名称 |
TEMPERATURE MEASURING EQUIPMENT FOR WAFER HOLDER AND WAFER HOLDER |
摘要 |
PROBLEM TO BE SOLVED: To provide temperature measuring equipment for a wafer holder having an excellent temperature measurement accuracy in which the entirety of the wafer holder is not required to be replaced when a temperature measuring element is damaged, and to provide a wafer holder employing it. SOLUTION: A temperature measuring element 1 is inserted into a bottomed tubular body 11 and at least the outer surface of the bottomed parts 11a is touched to the back surface opposite to the heating surface of a wafer holder 3 or a recess made in the back surface. A tubular part 11b on the other end side of the bottomed tubular body 11 and a reaction container 4 are sealed hermetically through an O-ring 5. Preferably, the contact area between the bottomed tubular body 11 and the wafer holder 3 is not smaller than 10 mm<SP>2</SP>, parallelism of the contact surfaces is 100μm or less, or the surface roughness Ra of the contact surface is 5μm or less. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004111586(A) |
申请公布日期 |
2004.04.08 |
申请号 |
JP20020270957 |
申请日期 |
2002.09.18 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
HASHIKURA MANABU;NAKADA HIROHIKO;NATSUHARA MASUHIRO;HIIRAGIDAIRA HIROSHI |
分类号 |
G01K1/14;H01L21/02;H05B3/00;H05B3/68;(IPC1-7):H01L21/02 |
主分类号 |
G01K1/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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