发明名称 TEMPERATURE MEASURING EQUIPMENT FOR WAFER HOLDER AND WAFER HOLDER
摘要 PROBLEM TO BE SOLVED: To provide temperature measuring equipment for a wafer holder having an excellent temperature measurement accuracy in which the entirety of the wafer holder is not required to be replaced when a temperature measuring element is damaged, and to provide a wafer holder employing it. SOLUTION: A temperature measuring element 1 is inserted into a bottomed tubular body 11 and at least the outer surface of the bottomed parts 11a is touched to the back surface opposite to the heating surface of a wafer holder 3 or a recess made in the back surface. A tubular part 11b on the other end side of the bottomed tubular body 11 and a reaction container 4 are sealed hermetically through an O-ring 5. Preferably, the contact area between the bottomed tubular body 11 and the wafer holder 3 is not smaller than 10 mm<SP>2</SP>, parallelism of the contact surfaces is 100μm or less, or the surface roughness Ra of the contact surface is 5μm or less. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004111586(A) 申请公布日期 2004.04.08
申请号 JP20020270957 申请日期 2002.09.18
申请人 SUMITOMO ELECTRIC IND LTD 发明人 HASHIKURA MANABU;NAKADA HIROHIKO;NATSUHARA MASUHIRO;HIIRAGIDAIRA HIROSHI
分类号 G01K1/14;H01L21/02;H05B3/00;H05B3/68;(IPC1-7):H01L21/02 主分类号 G01K1/14
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