发明名称 |
PATTERN FORMATION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a pattern formation method wherein degradation in dimensional accuracy of a pattern and the degrading in shape are suppressed. SOLUTION: The pattern formation method includes a step to form a first region 18 that has such a surface characteristic that a material for forming a pattern is deposited in priority and a second region 20 that has such a surface characteristic that a material for forming a pattern is harder to be deposited than the first region 18, and a step wherein the material for forming the pattern is supplied to a substrate 10 and the pattern is selectively formed in the first region 18. The material for forming the pattern is a solution containing metallic particles and it is supplied to the substrate 10 in liquid state. COPYRIGHT: (C)2004,JPO |
申请公布号 |
JP2004111818(A) |
申请公布日期 |
2004.04.08 |
申请号 |
JP20020275339 |
申请日期 |
2002.09.20 |
申请人 |
SEIKO EPSON CORP;MITANI TADAOKI |
发明人 |
NISHIKAWA HISAO;TAKAKUWA ATSUSHI;SHIMODA TATSUYA;MITANI TADAOKI;TERANISHI TOSHIJI;OKUBO TAKASHI |
分类号 |
G03F7/40;H01L21/027;H01L21/288;H01L21/3205;(IPC1-7):H01L21/288;H01L21/320 |
主分类号 |
G03F7/40 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|