发明名称 PATTERN FORMATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a pattern formation method wherein degradation in dimensional accuracy of a pattern and the degrading in shape are suppressed. SOLUTION: The pattern formation method includes a step to form a first region 18 that has such a surface characteristic that a material for forming a pattern is deposited in priority and a second region 20 that has such a surface characteristic that a material for forming a pattern is harder to be deposited than the first region 18, and a step wherein the material for forming the pattern is supplied to a substrate 10 and the pattern is selectively formed in the first region 18. The material for forming the pattern is a solution containing metallic particles and it is supplied to the substrate 10 in liquid state. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004111818(A) 申请公布日期 2004.04.08
申请号 JP20020275339 申请日期 2002.09.20
申请人 SEIKO EPSON CORP;MITANI TADAOKI 发明人 NISHIKAWA HISAO;TAKAKUWA ATSUSHI;SHIMODA TATSUYA;MITANI TADAOKI;TERANISHI TOSHIJI;OKUBO TAKASHI
分类号 G03F7/40;H01L21/027;H01L21/288;H01L21/3205;(IPC1-7):H01L21/288;H01L21/320 主分类号 G03F7/40
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