发明名称 |
PROCESS FOR PRODUCING GaAs SINGLE CRYSTAL |
摘要 |
PROBLEM TO BE SOLVED: To provide a process for producing a GaAs single crystal with a reduced number of surface defects. SOLUTION: In the process for producing the GaAs single crystal, the GaAs single crystal is cooled by employing a higher cooling rate for at least a part of a temperature range of 450-600°C than that employed at above 600°C. This shortens residence time of the GaAs single crystal at a temperature range of 450-600°C and therefore reduces the number of the surface defects observed when cutting the GaAs single crystal produced through the process and polishing the cut surface. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004107105(A) |
申请公布日期 |
2004.04.08 |
申请号 |
JP20020268934 |
申请日期 |
2002.09.13 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
YOSHIDA HIROAKI |
分类号 |
C30B29/42;C30B11/00;C30B15/20;(IPC1-7):C30B29/42 |
主分类号 |
C30B29/42 |
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