发明名称 PROCESS FOR PRODUCING GaAs SINGLE CRYSTAL
摘要 PROBLEM TO BE SOLVED: To provide a process for producing a GaAs single crystal with a reduced number of surface defects. SOLUTION: In the process for producing the GaAs single crystal, the GaAs single crystal is cooled by employing a higher cooling rate for at least a part of a temperature range of 450-600°C than that employed at above 600°C. This shortens residence time of the GaAs single crystal at a temperature range of 450-600°C and therefore reduces the number of the surface defects observed when cutting the GaAs single crystal produced through the process and polishing the cut surface. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004107105(A) 申请公布日期 2004.04.08
申请号 JP20020268934 申请日期 2002.09.13
申请人 SUMITOMO ELECTRIC IND LTD 发明人 YOSHIDA HIROAKI
分类号 C30B29/42;C30B11/00;C30B15/20;(IPC1-7):C30B29/42 主分类号 C30B29/42
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