发明名称 Panel testing apparatus
摘要 An panel testing apparatus is used to test the panel of a mainframe. When the panel is to be opened, the panel separates from the mainframe after the opening apparatus touches the switch. The fastening apparatus can clamp the front side of the panel easily because the lifting apparatus moves the panel to a higher position away from said mainframe. The panel and the rotating apparatus can rotate simultaneously. When closing said panel is desired, the rotating apparatus can push the back side of the panel. The panel and the rotating apparatus rotate toward the mainframe simultaneously until the switch locks the mainframe.
申请公布号 US2004065155(A1) 申请公布日期 2004.04.08
申请号 US20020295212 申请日期 2002.11.15
申请人 LIU TAI-SHENG;WU CHI-AN 发明人 LIU TAI-SHENG;WU CHI-AN
分类号 G01M99/00;G02F1/13;G06F1/16;(IPC1-7):G01N3/00 主分类号 G01M99/00
代理机构 代理人
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