发明名称 METHOD AND DEVICE FOR PHASE-DIFFERENCE MICROSCOPE FOCUS CONTROL
摘要 <P>PROBLEM TO BE SOLVED: To solve a problem in which the phenomenon that an edge of an observed image becomes sharp at a focusing point and out of focus at other points is noticable before when a sample is observed through an optical microscope, but this phenomenon is not applicable quite suitably to the observation of a particle body etc. in a sample medium by means of a phase-difference microscope. <P>SOLUTION: An observed image of the phase-difference microscope is analyzed to regard as an optimum focus point the position where the sizes and number of images of an observed solid body are maximum. Further, proposed a method of selective focusing on a specified observed object by focus control in which the shape of the observed object is noticed. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004109305(A) 申请公布日期 2004.04.08
申请号 JP20020269790 申请日期 2002.09.17
申请人 ARIO TECHNO KK 发明人 TAKEUCHI AKIRA
分类号 G02B21/00;G06T1/00;G06T7/60 主分类号 G02B21/00
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