发明名称 Wafer with a relaxed useful layer and method of forming the wafer
摘要 A process for forming a useful layer (6) from a wafer (10), the wafer (10) comprising a supporting substrate (1) and a strained layer (2) that are chosen respectively from crystalline materials. The process includes a first step of forming a region of perturbation (3) in the supporting substrate (1) at a defined depth by creating structural perturbations that cause at least relative relaxation of the elastic strains in the strained layer (2). A second step of supplying energy causes at least relative relaxation of the elastic strains in the strained layer (2). A portion of the wafer (10) is removed from the opposite side from the relaxed strained layer (2'), the useful layer (6) being the remaining portion of the wafer (10). The present invention also relates to an application of the process and to wafers produced during the process.
申请公布号 US2004067622(A1) 申请公布日期 2004.04.08
申请号 US20030663917 申请日期 2003.09.17
申请人 AKATSU TAKESHI;GHYSELEN BRUNO 发明人 AKATSU TAKESHI;GHYSELEN BRUNO
分类号 H01L21/20;H01L21/762;(IPC1-7):H01L21/30;H01L21/46 主分类号 H01L21/20
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