| 摘要 |
The invention relates to a test device comprising a test board (3) from which contact elements project, and spring-finger connectors (5) that are connected to the external contacts of an integrated circuit type. For each of the external contact positions of a given circuit type a modular component (8) is provided and comprises at least one electrically conductive contact plate and an insulating carrier plate. Said contact plate is incorporated into recesses of the carrier plate and comprises a contact section, a spring section, and a retaining section. |
