| 摘要 |
PROBLEM TO BE SOLVED: To prevent images from generating interference fringes by restricting the surface roughness of a conductive substrate, and to enable measurement of layer thicknesses by an optical interference method with good accuracy. SOLUTION: The conductive substrate 11 disposed at an electrophotographic photoreceptor 10 is so finished that its surface roughness satisfies (a) a maximum height (Ry)=0.8 to 1.4μm, arithmetic mean deviation of profile (Ra)=0.10 to 0.15μm, ten-point mean roughness (Rz)=0.7 to 1.3μm, mean spacing between peaks (Sm)=5 to 30μm and a peak count PC=60 to 100. Such photoreceptor 10 is prevented from generating the interference fringes by suitably scattering light for exposure and is formed with the interference patterns during the measurement of the layer thickness of the photosensitive layer 15 in the light interference method. The layer thickness is thus measured with the good accuracy. COPYRIGHT: (C)2004,JPO |
