发明名称 DOOR OPENING/CLOSING TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To solve the problem that the opening/closing speed of a door to be tested is not fixed even when the opening/closing speed of a testing device is fixed and it is difficult to set testing conditions, because the connecting section between the arm of the testing device and the door to be tested slides during the course of opening/closing tests and the relative angle between the arm of the testing device and door to be tested continuously changes due to the difference in center of rotation between the door and testing device. SOLUTION: A door opening/closing testing device is provided with a rotary arm 4 which makes the center of rotation of the door 2 to be tested in the direction of a rotating shaft to coincide with that of the testing device in the direction of the rotating shaft, connecting means 3, 5, and 6 which connect the door 2 to the arm 4, and a rotating means 8 which rotates the arm 4. In addition, the rotating means 8 rotates the door 2, which is connected to the arm 4 by means of the connecting means 3, 5, and 6 so that the centers of rotation in the directions of the rotating shaft of the door 2 and arm 4 may become the same, together with the arm 4 by rotating the arm 4 while the door 2 is attached to an article 1 to be tested. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004108983(A) 申请公布日期 2004.04.08
申请号 JP20020273099 申请日期 2002.09.19
申请人 MITSUBISHI ELECTRIC CORP 发明人 NAKANO HIDEAKI
分类号 G01M99/00;G01N3/32;(IPC1-7):G01M19/00 主分类号 G01M99/00
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